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NaioSTM

Microscope
Atomic Force Microscope

Description

 

The NaioSTM is a Scanning Tunneling Microscope that is classified as an important tool in nanotechnology. It makes it possible to see individual atoms since the STM is based on quantum tunneling, where a voltage difference (bias) is applied between the tip and the sample surface. It is applied to metal surfaces or other conducting materials.

Features :

Scanning Tunneling Microscopy allows to map a conductive sample's surface atom by atom with ultra-high resolution, without the use of electron beams or light and has revealed insights into the matter at the atomic level for nearly forty years.


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