Description

The NaioAFM is an atomic force microscope that can measure the topography and several other properties of a sample with nanometer resolution. These measurements are performed, displayed, and evaluated using the Naio control software.

Features :

The AFM is used to image the topography of soft biological materials in their native environments.It can also be used to probe the mechanical properties of cells and extracellular matrices, including their intrinsic elastic modulus and receptor-ligand interactions.